This translation maintains the technical terminology:
- BiCMOS: Refers to the semiconductor technology combining Bipolar and CMOS structures.
- Low-power current-mode PWM controller: Describes the chip’s operational principle (current-mode control) and efficiency (low power consumption).
- Aging socket: A test fixture for accelerated life testing of semiconductor devices.
- Si/SiC MOSFETs: Specifies compatibility with both Silicon (Si) and Silicon Carbide (SiC) power transistors.
For context:
- Such controllers (e.g., TI UCC28C43D) support up to 1 MHz switching frequencies, ±1A peak drive current, and 35ns response times, making them suitable for high-reliability power systems.
- Aging tests focus on validating parameters like threshold voltage drift and bond-wire degradation under thermal/electrical stress.
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